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Life testing and reliability predictions for electromechanical relays: an industry expert discusses use of the Weibull distribution for life testing electromechanical ... An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on June 1, 2004. The length of the article is 1426 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Life testing and reliability predictions for electromechanical relays: an industry expert discusses use of the Weibull distribution for life testing electromechanical relays.(Life Testing) Author: Phil Roettjer Publication:EE-Evaluation Engineering (Refereed) Date: June 1, 2004 Publisher: Nelson Publishing Volume: 43 Issue: 6 Page: 58(4) Distributed by Thomson Gale.
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Component-based technologies in test and measurement.(PC-Based Test): An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on October 1, 2003. The length of the article is 2825 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Component-based technologies in test and measurement.(PC-Based Test) Author: Cesar Gamez Publication:EE-Evaluation Engineering (Refereed) Date: October 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 10 Page: 12(5) Distributed by Thomson Gale.
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ATE Buyers Guide.: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on May 1, 2002. The length of the article is 6148 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: ATE Buyers Guide. Publication:EE-Evaluation Engineering (Refereed) Date: May 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 5 Page: 52(10) Distributed by Thomson Gale.
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CTR or TBR-that is the question: Since using CTRs to prove compliance with the R&TTE directive is prohibited, find out which harmonized standards are replacing ... An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on February 1, 2002. The length of the article is 1482 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: CTR or TBR-that is the question: Since using CTRs to prove compliance with the R&TTE directive is prohibited, find out which harmonized standards are replacing them. (Dealing with EMC). Author: Nicholas P. Wright Publication:EE-Evaluation Engineering (Refereed) Date: February 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 2 Page: 56(3) Distributed by Thomson Gale.
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Methods for measuring periodic modulations: don't let jitter analysis shake you up. Here are some guidelines to help you choose which instrument to use ... An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on September 1, 2003. The length of the article is 1999 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Methods for measuring periodic modulations: don't let jitter analysis shake you up. Here are some guidelines to help you choose which instrument to use for your particular application.(Communications Test) Author: Craig Emmerich Publication:EE-Evaluation Engineering (Refereed) Date: September 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 9 Page: 44(4) Distributed by Thomson Gale.
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End USB noise without stopping the bus: judicious choice of filtering methods and components suppresses noise but leaves desired signals alone. (Dealing ... An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on June 1, 2002. The length of the article is 1409 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: End USB noise without stopping the bus: judicious choice of filtering methods and components suppresses noise but leaves desired signals alone. (Dealing with EMC). Author: Jonathan Davis Publication:EE-Evaluation Engineering (Refereed) Date: June 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 6 Page: 50(5) Distributed by Thomson Gale.
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Look Ma, no batteries. (Editorial).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on January 1, 2002. The length of the article is 602 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Look Ma, no batteries. (Editorial). Publication:EE-Evaluation Engineering (Refereed) Date: January 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 1 Page: 8(1) Distributed by Thomson Gale.
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EMC engineering--A constant challenge: Here are three basic suggestions that can make EMC engineering more effective. (Dealing with EMC).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on March 1, 2002. The length of the article is 2685 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: EMC engineering--A constant challenge: Here are three basic suggestions that can make EMC engineering more effective. (Dealing with EMC). Author: Jud Strock Publication:EE-Evaluation Engineering (Refereed) Date: March 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 3 Page: 56(7) Distributed by Thomson Gale.
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Reducing test time for fiber-optic voltage controllers.(Fiber-Optics Test): An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on October 1, 2003. The length of the article is 1125 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Reducing test time for fiber-optic voltage controllers.(Fiber-Optics Test) Author: George Atherton Publication:EE-Evaluation Engineering (Refereed) Date: October 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 10 Page: 60(2) Distributed by Thomson Gale.
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Backdrive current-sensing techniques provide ICT benefits. (Board ATE).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on February 1, 2002. The length of the article is 2580 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Backdrive current-sensing techniques provide ICT benefits. (Board ATE). Author: Alan Albee Publication:EE-Evaluation Engineering (Refereed) Date: February 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 2 Page: 30(5) Distributed by Thomson Gale.
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