Books about Characterization from Amazon.com

Thin-film solar cells are either emerging or about to emerge from the research laboratory to become commercially available devices finding practical various applications Currently no textbook outlining the basic theoretical background, methods of fabrication and applications currently exist. Thus, this book aims to present for the first time an in-depth overview of this topic covering a broad range of thin-film solar cell technologies including both organic and inorganic materials, presented in a systematic fashion, by the scientific leaders in the respective domains. It covers a broad range of related topics, from physical principles to design, fabrication, characterization, and applications of novel photovoltaic devices..
Price: $203.94 [Notify me when price goes down.]

This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.

Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:

• Updated and revised figures and examples reflecting the most current data and information
• 260 new references offering access to the latest research and discussions in specialized topics
• New problems and review questions at the end of each chapter to test readers' understanding of the material

In addition, readers will find fully updated and revised sections in each chapter.

Plus, two new chapters have been added:

• Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.
• Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department..
Price: $87.34 [Notify me when price goes down.]

A collection of sixty-five monologues providing young performers with a variety of audition pieces reflecting situations both serious and comic..
Price: $2.00 [Notify me when price goes down.]

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered..
Price: $85.00 [Notify me when price goes down.]

Measure, simulate, and model power distribution networks (PDNs) accurately and efficiently with this new, cutting-edge resource Frequency-domain analysis has revolutionized component design, and this book shows you, step-by-step, how to accurately characterize PDN components in the frequency domain including vias, bypass capacitors, planes, DC-DC converters and systems. Guiding you through the many alternatives to characterizing PDNs, it helps you to improve accuracy by choosing the right technique and avoiding the common pitfalls.

Practical examples point out the strengths and weaknesses of simulation tools as well as explain setting parameters and options. The book presents best practices for measuring that aid you in the selection of calibration processes, instruments, probes, and cables. You learn how to use frequency-domain simulations and measurements to model printed-circuit board elements, including vias, planes, bypass capacitors, inductors, and DC-DC converters. Over 300 illustrations and more than 150 equations support key topics throughout the book..
Price: $99.75 [Notify me when price goes down.]

Thin film deposition is a broad and burgeoning field, with applications ranging from razor blade coatings to quantum-well lasers. However, much of the available thin film literature is based on empirical knowledge, and focuses only on specific processes or applications. This volume rectifies that situation, offering a complete description od the theory and technology of thin film deposition. The book's broad perspective gives readers the tools to objectively evaluate and choose the appropriate thin film process for a specific application. This indispensable volume also includes a complete list of symbols and an extensive index..
Price: $59.99 [Notify me when price goes down.]

Reservoir characterization as a discipline grew out of the recognition that more oil and gas could be extracted from reservoirs if the geology of the reservoir was understood. Prior to that awakening, reservoir development and production were the realm of the petroleum engineer. In fact, geologists of that time would have felt slighted if asked by corporate management to move from an exciting exploration assignment to a more mundane assignment working with an engineer to improve a reservoir's performance.
Slowly, reservoir characterization came into its own as a quantitative, multidisciplinary endeavor requiring a vast array of skills and knowledge sets. Perhaps the biggest attractor to becoming a reservoir geologist was the advent of fast computing, followed by visualization programs and theaters, all of which allow young geoscientists to practice their computing skills in a highly technical work environment. Also, the discipline grew in parallel with the evolution of data integration and the advent of asset teams in the petroleum industry. Finally, reservoir characterization flourished with the quantum improvements that have occurred in geophysical acquisition and processing techniques and that allow geophysicists to image internal reservoir complexities..
Price: $117.60 [Notify me when price goes down.]

A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

• Signal integrity from a measurement point of view

• Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes

• Bit error ratio measurements for both electrical and optical links

• Extensive coverage on the topic of jitter in high-speed networks

• State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals

• Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing

• Channel and system characterization: TDR/T and frequency domain-based alternatives

• Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM

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Price: $59.98 [Notify me when price goes down.]

Published in 1991, the first edition of The Practical Handbook of Ground-Water Monitoring quickly became the gold standard reference on the topic of ground-water monitoring. But, as in all rapidly evolving fields, regulations change, technology advances, methods improve, and research reveals flaws in prior thinking. As a consequence, books that document the state of the science, even widely acknowledged definitive works, become outdated and need to be rewritten periodically to stay current. Reflecting this and renamed to highlight its wider scope, The Practical Handbook of Environmental Site Characterization and Ground-Water Monitoring, Second Edition provides an updated look at the field. Completely revised, the book contains so much new information that it has doubled in size.

Containing the most up-to-date information available, this second edition emphasizes the practical application of current technology. It covers environmental site characterization and ground-water monitoring in great detail, from the federal regulations that govern environmental investigations, to the various direct and indirect methods of investigating and monitoring the subsurface, to the analysis and interpretation of complex sets of environmental data.

Cheaper, better, faster was the mantra of the 1990s, resulting in more streamlined approaches to both environmental site characterization and ground-water monitoring, but also pitting the application of good science against the mandate to get a project done as quickly and inexpensively as possible. This book provides unbiased, technical discussions of the tremendously powerful tools developed in the last decade, helping environmental professionals strike a balance between good science and economics..
Price: $134.48 [Notify me when price goes down.]