Books about Characterizations from Amazon.com

Thin-film solar cells are either emerging or about to emerge from the research laboratory to become commercially available devices finding practical various applications Currently no textbook outlining the basic theoretical background, methods of fabrication and applications currently exist. Thus, this book aims to present for the first time an in-depth overview of this topic covering a broad range of thin-film solar cell technologies including both organic and inorganic materials, presented in a systematic fashion, by the scientific leaders in the respective domains. It covers a broad range of related topics, from physical principles to design, fabrication, characterization, and applications of novel photovoltaic devices..
Price: $203.94 [Notify me when price goes down.]

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.

Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/

Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source..
Price: $63.44 [Notify me when price goes down.]

This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.

Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:

• Updated and revised figures and examples reflecting the most current data and information
• 260 new references offering access to the latest research and discussions in specialized topics
• New problems and review questions at the end of each chapter to test readers' understanding of the material

In addition, readers will find fully updated and revised sections in each chapter.

Plus, two new chapters have been added:

• Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.
• Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department..
Price: $87.37 [Notify me when price goes down.]

Thin film deposition is a broad and burgeoning field, with applications ranging from razor blade coatings to quantum-well lasers. However, much of the available thin film literature is based on empirical knowledge, and focuses only on specific processes or applications. This volume rectifies that situation, offering a complete description od the theory and technology of thin film deposition. The book's broad perspective gives readers the tools to objectively evaluate and choose the appropriate thin film process for a specific application. This indispensable volume also includes a complete list of symbols and an extensive index..
Price: $59.99 [Notify me when price goes down.]

A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

• Signal integrity from a measurement point of view

• Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes

• Bit error ratio measurements for both electrical and optical links

• Extensive coverage on the topic of jitter in high-speed networks

• State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals

• Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing

• Channel and system characterization: TDR/T and frequency domain-based alternatives

• Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM

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Price: $59.98 [Notify me when price goes down.]

* An accessible resource, covering the fundamentals of carbonate reservoir engineering
* Includes discussions on how, where and why carbonate are formed, plus reviews of basic sedimentological and stratigraphic principles to explain carbonate platform characteristics and stratigraphic relationships
* Offers a new, genetic classification of carbonate porosity that is especially useful in predicting spatial distribution of pore networks.
* Includes a solution manual.
Price: $64.52 [Notify me when price goes down.]

Reservoir characterization as a discipline grew out of the recognition that more oil and gas could be extracted from reservoirs if the geology of the reservoir was understood. Prior to that awakening, reservoir development and production were the realm of the petroleum engineer. In fact, geologists of that time would have felt slighted if asked by corporate management to move from an exciting exploration assignment to a more mundane assignment working with an engineer to improve a reservoir's performance.
Slowly, reservoir characterization came into its own as a quantitative, multidisciplinary endeavor requiring a vast array of skills and knowledge sets. Perhaps the biggest attractor to becoming a reservoir geologist was the advent of fast computing, followed by visualization programs and theaters, all of which allow young geoscientists to practice their computing skills in a highly technical work environment. Also, the discipline grew in parallel with the evolution of data integration and the advent of asset teams in the petroleum industry. Finally, reservoir characterization flourished with the quantum improvements that have occurred in geophysical acquisition and processing techniques and that allow geophysicists to image internal reservoir complexities..
Price: $119.32 [Notify me when price goes down.]