Books about Manufacturability from Amazon.com

This 2008 book shows how to design products for all aspects of manufacturability and use multifunctional product development teams and Concurrent Engineering principles to achieve the goals cited in the sub-title:

DESIGN FOR LOW COST. The book presents many effective methodologies to design low-cost products by concurrently engineering products in multifunctional teams that will simplify concepts, optimize architecture, optimize the use of modules and off-the-shelf parts, have pre-selected vendors help design custom parts, understand and avoid previous problems, and then thoroughly design for manufacturability for quick launches without expensive change orders.

DESIGN IN HIGH QUALITY. Chapter 10 shows how to design quality and reliability into the product with poka-yoke and 50 design guidelines.

DESIGN FOR LEAN MANUFACTURE. The book shows how to standardize parts and design products for lean production, JIT, build-to-order, and mass customization.

DESIGN QUICKLY FOR FAST PRODUCTION. Chapter 3 shows how thorough up-front work is the key to quickly developing products, avoiding changes, and achieving fast ramps..
Price: $49.95 [Notify me when price goes down.]

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to

• understanding the causes of variability;
• design of test structures for variability characterization;
• statistically rigorous data analysis;
• techniques of design for manufacturability in lithography and in chemical mechanical polishing;
• statistical simulation, analysis, and optimization techniques for improving parametric yield.

Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.

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Price: $85.66 [Notify me when price goes down.]

Analog integrated circuits are very important as interfaces between the digital parts of integrated electronic systems and the outside world. A large portion of the effort involved in designing these circuits is spent in the layout phase. Whereas the physical design of digital circuits is automated to a large extent, the layout of analog circuits is still a manual, time-consuming and error-prone task. This is mainly due to the continuous nature of analog signals, which causes analog circuit performance to be very sensitive to layout parasitics. The parasitic elements associated with interconnect wires cause loading and coupling effects that degrade the frequency behaviour and the noise performance of analog circuits. Device mismatch and thermal effects put a fundamental limit on the achievable accuracy of circuits. For successful automation of analog layout, advanced place and route tools that can handle these critical parasitics are required.
In the past, automatic analog layout tools tried to optimize the layout without quantifying the performance degradation introduced by layout parasitics. Therefore, it was not guaranteed that the resulting layout met the specifications and one or more layout iterations could be needed. In Analog Layout Generation for Performance andManufacturability, the authors propose a performance driven layout strategy to overcome this problem. In this methodology, the layout tools are driven by performance constraints, such that the final layout, with parasitic effects, still satisfies the specifications of the circuit. The performance degradation associated with an intermediate layout solution is evaluated at runtime using predetermined sensitivities. In contrast with other performance driven layout methodologies, the tools proposed in this book operate directly on the performance constraints, without an intermediate parasitic constraint generation step. This approach makes a complete and sensible trade-off between the different layout alternatives possible at runtime and therefore eliminates the possible feedback route between constraint derivation, placement and layout extraction.
Besides its influence on the performance, layout also has a profound impact on the yield and testability of an analog circuit. In AnalogLayout Generation for Performance and Manufacturability, the authors outline a new criterion to quantify the detectability of a fault and combine this with a yield model to evaluate the testability of an integrated circuit layout. They then integrate this technique with their performance driven routing algorithm to produce layouts that have optimal manufacturability while still meeting their performance specifications.
Analog Layout Generation for Performance and Manufacturability will be of interest to analog engineers, researchers and students..
Price: $135.29 [Notify me when price goes down.]

Addresses important topics of DFM, including how it relates to Concurrent Engineering, management issues, getting started in DFM, how to justify using DFM, applying quality tools and how DFM is affecting computer technology (and vice versa). Covers topics starting with the creative thinking process to combining DFM with geometrical dimensioning and tolerancing. Also includes product design information that designers should know when committing pen to paper or mouse to pad..
Price: $115.00 [Notify me when price goes down.]

Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, mask planning, simulation and manufacturing, and through statistical design and statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design’s manufacturability and yield. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

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Price: $89.15 [Notify me when price goes down.]

This book represents a compendium of fundamental problem formulations of analog design centering and sizing. It provides a differentiated knowledge about the tasks of analog design centering and sizing. In particular the worst-case problem will be formulated. It stands at the interface between process technology and design technology.

This book wants to point out that and how both process and design technology are required for its solution. The intention is to enable analog and mixed-signal designers to assess CAD solution methods that are presented to them. On the other side, the intention is to enable developers of analog CAD tools to formulate and develop solution approaches for analog design centering and sizing.

The structure of the book is geared towards a combination of a reference book and a textbook. The formulations of tasks and solution approaches by mathematical means makes the book suitable as well for students dealing with analog design and design methodology.

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Price: $89.15 [Notify me when price goes down.]